검색결과 : 18건
| No. | Article |
|---|---|
| 1 |
Nanobeam Diffraction: Technique Evaluation and Strain Measurement on Complementary Metal Oxide Semiconductor Devices Favia P, Gonzales MB, Simoen E, Verheyen P, Klenov D, Bender H Journal of the Electrochemical Society, 158(4), H438, 2011 |
| 2 |
Stability of silicon germanium stressors Tomasini P, Machkaoutsan V, Thomas SG, Loo R, Caymax M, Verheyen P Thin Solid Films, 518, S133, 2010 |
| 3 |
Leakage current study of Si1-xCx embedded source/drain junctions Simoen E, Vissouvanadin B, Taleb N, Gonzalez MB, Verheyen P, Loo R, Claeys C, Machkaoutsan V, Bauer M, Thomas S, Lu JP, Wise R Applied Surface Science, 254(19), 6140, 2008 |
| 4 |
Reduced self-heating by strained silicon substrate engineering O'Neill A, Agaiby R, Olsen S, Yang Y, Hellstrom PE, Ostling M, Oehme M, Lyutovich K, Kasper E, Eneman G, Verheyen P, Loo R, Claeys C, Fiegna C, Sangiorgi E Applied Surface Science, 254(19), 6182, 2008 |
| 5 |
Multi-gate devices for the 32 nm technology node and beyond Collaert N, De Keersgieter A, Dixit A, Ferain I, Lai LS, Lenoble D, Mercha A, Nackaerts A, Pawlak BJ, Rooyackers R, Schulz T, San KT, Son NJ, Van Dal MJH, Verheyen P, von Arnim K, Witters L, Meyer KD, Biesemans S, Jurczak M Solid-State Electronics, 52(9), 1291, 2008 |
| 6 |
Multi-gate devices for the 32 nm technology node and beyond: Challenges for Selective Epitaxial Growth Collaert N, Rooyackers R, Hikavyy A, Dixit A, Leys F, Verheyen P, Loo R, Jurczak M, Biesemans S Thin Solid Films, 517(1), 101, 2008 |
| 7 |
pMOS transistor with embedded SiGe: Elastic and plastic relaxation issues Hikavyy A, Bhouri N, Loo R, Verheyen P, Clemente F, Hopkins J, Trussell R, Caymax M Thin Solid Films, 517(1), 113, 2008 |
| 8 |
Leakage current control in recessed SiGe Source/Drain junctions Claeys C, Gonzalez MB, Eneman G, Verheyen P, Bender H, Schreutelkamp R, Washington L, Nouri F, Simoen E Journal of the Electrochemical Society, 154(9), H814, 2007 |
| 9 |
Quantifying self-heating effects with scaling in globally strained Si MOSFETs Agaiby R, Yang Y, Olsen SH, O'Neill AG, Eneman G, Verheyen P, Loo R, Claeys C Solid-State Electronics, 51(11-12), 1473, 2007 |
| 10 |
Analysis of the leakage current origin in thin strain relaxed buffer substrates Eneman G, Simoen E, Delhougne R, Verheyen P, Simons V, Loo R, Caymax M, Claeys C, Vandervorst W, De Meyer K Journal of the Electrochemical Society, 153(5), G379, 2006 |