검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Advanced Photoresist Technologies by Intricate Molecular Brush Architectures: Diblock Brush Terpolymer-Based Positive-Tone Photoresist Materials Sun GR, Cho SH, Yang F, He X, Pavia-Sanders A, Clark C, Raymond JE, Verkhoturov SV, Schweikert EA, Thackeray JW, Trefonas P, Wooley KL Journal of Polymer Science Part A: Polymer Chemistry, 53(2), 193, 2015 |
| 2 |
Nanoscopic Cylindrical Dual Concentric and Lengthwise Block Brush Terpolymers as Covalent Preassembled High-Resolution and High-Sensitivity Negative-Tone Photoresist Materials Sun GR, Cho SH, Clark C, Verkhoturov SV, Eller MJ, Li A, Pavia-Jimenez A, Schweikert EA, Thackeray JW, Trefonas P, Wooley KL Journal of the American Chemical Society, 135(11), 4203, 2013 |
| 3 |
Molecular ion emission from single large cluster impacts Verkhoturov SV, Rickman RD, Guillemier C, Hager GJ, Locklear JE, Schweikert EA Applied Surface Science, 252(19), 6490, 2006 |
| 4 |
Au-analyte adducts resulting from single massive gold cluster impacts Hager GJ, Guillermier C, Verkhoturov SV, Schweikert EA Applied Surface Science, 252(19), 6558, 2006 |
| 5 |
Matrix-enhanced cluster-SIMS Locklear JE, Guillermier C, Verkhoturov SV, Schweikert EA Applied Surface Science, 252(19), 6624, 2006 |
| 6 |
Organic SIMS with single massive gold projectile: Ion yield enhancement by silver metallization Guillermier C, Pinnick V, Verkhoturov SV, Schweikert EA Applied Surface Science, 252(19), 6644, 2006 |
| 7 |
Cluster secondary ion mass spectrometry: an insight into super-efficient" collision cascades Rickman RD, Verkhoturov SV, Schweikert EA Applied Surface Science, 231-2, 54, 2004 |
| 8 |
Characterization of surface structure by cluster coincidental ion mass spectrometry Rickman RD, Verkhoturov SV, Balderas S, Bestaoui N, Clearfield A, Schweikert EA Applied Surface Science, 231-2, 106, 2004 |
| 9 |
Nanodomain analysis via coincidence ion mass spectrometry Verkhoturov SV, Rickman RD, Balderas S, Schweikert EA Applied Surface Science, 231-2, 113, 2004 |
| 10 |
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry Li Z, Rickman RD, Verkhoturov SV, Schweikert EA Applied Surface Science, 231-2, 328, 2004 |