검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A self-growing hidden Markov tree for wafer map inspection Chen JH, Hsu CJ, Chen CC Journal of Process Control, 19(2), 261, 2009 |
| 2 |
Improved process control, lowered costs and reduced risks through the use of non-destructive mobility and sheet carrier density measurements on GaAs and GaN wafers Nguyen D, Hogan K, Blew A, Cordes M Journal of Crystal Growth, 272(1-4), 59, 2004 |