화학공학소재연구정보센터
검색결과 : 39건
No. Article
1 Estimation of Ga adatom diffusion length for GaP growth by molecular beam epitaxy
Piedra-Lorenzana JA, Yamane K, Shiota K, Fujimoto J, Tanaka S, Sekiguchi H, Okada H, Wakahara A
Journal of Crystal Growth, 512, 37, 2019
2 Regularly arranged Eu-doped GaN nanocolumns grown by RF-plasma-assisted molecular beam epitaxy through Ti-mask selective-area growth technique
Sekiguchi H, Date K, Imanishi T, Tateishi H, Yamane K, Okada H, Kishino K, Wakahara A
Journal of Crystal Growth, 511, 73, 2019
3 Impact of temperature and nitrogen composition on the growth of GaAsPN alloys
Yamane K, Mugikura S, Tanaka S, Goto M, Sekiguchi H, Okada H, Wakahara A
Journal of Crystal Growth, 486, 24, 2018
4 Doping control of GaAsPN alloys by molecular beam epitaxy for monolithic III-V/Si tandem solar cells
Yamane K, Sato K, Sekiguchi H, Okada H, Wakahara A
Journal of Crystal Growth, 473, 55, 2017
5 Molecular-beam epitaxy growth of dilute GaAsN alloys by surface nitridation
Urakami N, Yamane K, Sekiguchi H, Okada H, Wakahara A
Journal of Crystal Growth, 435, 19, 2016
6 Novel selective area growth (SAG) method for regularly arranged AlGaN nanocolumns using nanotemplates
Yamano K, Kishino K, Sekiguchi H, Oto T, Wakahara A, Kawakami Y
Journal of Crystal Growth, 425, 316, 2015
7 Growth of dilute BGaP alloys by molecular beam epitaxy
Urakami N, Fukami F, Sekiguchi H, Okada H, Wakahara A
Journal of Crystal Growth, 378, 96, 2013
8 Effects of Mg doping on the electrical and luminescence characterizations of p-type GaAsN alloys grown by MBE
Umeno K, Furukawa Y, Urakami N, Mitsuyoshi S, Yonezu H, Wakahara A
Journal of Crystal Growth, 312(2), 231, 2010
9 Growth of low defect density GaP layers on Si substrates within the critical thickness by optimized shutter sequence and post-growth annealing
Yamane K, Kawai T, Furukawa Y, Okada H, Wakahara A
Journal of Crystal Growth, 312(15), 2179, 2010
10 Epitaxial growth of Sc-doped ZnO films on Si by sol-gel route
Sharma R, Sehrawat K, Wakahara A, Mehra RM
Applied Surface Science, 255(11), 5781, 2009