검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Ion-induced emission microscopies Doyle BL, Walsh DS, Vizkelethy G, Rossi P, McDaniel FD, Schenkel T, McDonald J, Hamza AV Current Applied Physics, 3(1), 31, 2003 |
| 2 |
Analysis of B-SiO2 films by highly charged ion based time-of-flight secondary ion mass spectrometry, standard secondary ion mass spectrometry and elastic recoil detection Schenkel T, Hamza AV, Barnes AV, Schneider DH, Walsh DS, Doyle BL Journal of Vacuum Science & Technology A, 16(3), 1384, 1998 |