화학공학소재연구정보센터
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No. Article
1 Novel method for cleaning a vacuum chamber from hydrocarbon contamination
Wanzenboeck HD, Roediger P, Hochleitner G, Bertagnolli E, Buehler W
Journal of Vacuum Science & Technology A, 28(6), 1413, 2010
2 Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF2 on SiO2
Ebm C, Hobler G, Waid S, Wanzenboeck HD
Journal of Vacuum Science & Technology B, 28(5), 946, 2010
3 Nanoimprint lithography stamp modification utilizing focused ion beams
Wanzenboeck HD, Waid S, Bertagnolli E, Muehlberger M, Bergmair I, Schoeftner R
Journal of Vacuum Science & Technology B, 27(6), 2679, 2009
4 Evaluation of chamber contamination in a scanning electron microscope
Roediger P, Wanzenboeck HD, Hochleitner G, Bertagnolli E
Journal of Vacuum Science & Technology B, 27(6), 2711, 2009
5 Electron beam induced deposition of iron nanostructures
Hochleitner G, Wanzenboeck HD, Bertagnolli E
Journal of Vacuum Science & Technology B, 26(3), 939, 2008
6 Custom design of optical-grade thin films of silicon oxide by direct-write electron-beam-induced deposition
Wanzenboeck HD, Fischer M, Svagera R, Wernisch J, Bertagnolli E
Journal of Vacuum Science & Technology B, 24(6), 2755, 2006
7 Compositional and electrical properties of zirconium dioxide thin films chemically deposited on silicon
Harasek S, Wanzenboeck HD, Bertagnolli E
Journal of Vacuum Science & Technology A, 21(3), 653, 2003
8 Metal-organic chemical vapor deposition and nanoscale characterization of zirconium oxide thin films
Harasek S, Wanzenboeck HD, Basnar B, Smoliner J, Brenner J, Stoeri H, Gornik E, Bertagnolli E
Thin Solid Films, 414(2), 199, 2002