검색결과 : 1건
No. | Article |
---|---|
1 |
Investigation of Ta grain boundary diffusion in copper by means of Auger electron spectroscopy Erdelyi G, Langer G, Nyeki J, Kover L, Tomastik C, Werner WM, Csik A, Stoeri H, Beke DL Thin Solid Films, 459(1-2), 303, 2004 |