검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The impact of interface roughness scattering and degeneracy in relaxed and strained Si n-channel MOSFETs Watling JR, Yang L, Borici M, Wilkins RCW, Asenov A, Barker JR, Roy S Solid-State Electronics, 48(8), 1337, 2004 |
| No. | Article |
|---|---|
| 1 |
The impact of interface roughness scattering and degeneracy in relaxed and strained Si n-channel MOSFETs Watling JR, Yang L, Borici M, Wilkins RCW, Asenov A, Barker JR, Roy S Solid-State Electronics, 48(8), 1337, 2004 |