검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
How do 10-camphorsulfonic acid, silver or aluminum nanoparticles influence optical, electrochemical, electrochromic and photovoltaic properties of air and thermally stable triphenylamine-based polyazomethine with carbazole moieties? Iwan A, Boharewicz B, Tazbir I, Filapek M, Korona KP, Wrobel P, Stefaniuk T, Ciesielski A, Wojtkiewicz J, Wronkowska AA, Wronkowski A, Zboromirska-Wnukiewicz B, Grankowska-Ciechanowicz S, Kaminska M, Szoplik T Electrochimica Acta, 185, 198, 2015 |
| 2 |
Optical properties of laser induced oxynitride films on titanium Skowronski L, Antonczak AJ, Trzcinski M, Lazarek L, Hiller T, Bukaluk A, Wronkowska AA Applied Surface Science, 304, 107, 2014 |
| 3 |
Characterisation of coloured TiOx/Ti/glass systems Skowronski L, Trzcinski M, Antonczak AJ, Domanowski P, Kustra M, Wachowiak W, Naparty MK, Hiller T, Bukaluk A, Wronkowska AA Applied Surface Science, 322, 209, 2014 |
| 4 |
Optical spectra of Zn1-xBexTe mixed crystals determined by IR-VIS-UV ellipsometry and photoluminescence measurements Wronkowska AA, Arwin H, Firszt F, Legowski S, Wronkowski A, Skowronski L Thin Solid Films, 519(9), 2795, 2011 |
| 5 |
Spectroscopic ellipsometry study of the dielectric response of Au-In and Ag-Sn thin-film couples Wronkowska AA, Wronkowski A, Kuklinski K, Senski M, Skowronski L Applied Surface Science, 256(15), 4839, 2010 |
| 6 |
Structural analysis of In/Ag, In/Cu and In/Pd thin films on tungsten by ellipsometric, XRD and AES methods Wronkowska AA, Wronkowski A, Bukaluk A, Trzcinski M, Okulewicz K, Skowronski L Applied Surface Science, 254(14), 4401, 2008 |
| 7 |
Characterization of In/Pd and Pd/In/Pd thin films by ellipsometric, XRD and AES methods Wronkowska AA, Wronkowski A, Bukaluk A, Trzcinski M, Okulewicz K Applied Surface Science, 253(7), 3367, 2007 |
| 8 |
IR ellipsometry and photoluminescence investigations of Zn1-xBexSe and Zn1-x-yBexMnySe mixed crystals Wronkowska AA, Bejtka K, Arwin H, Wronkowski A, Firszt E, Legowski S, Meczynska H, Marasek A Thin Solid Films, 455-56, 256, 2004 |
| 9 |
Investigations of Cd1-xMnxTe crystals by means of ellipsometry and auger electron spectroscopy Wronkowska AA, Wronkowski A, Bukaluk A, Stefanski M, Arwin H, Firszt F, Legowski S, Meczynska H, Hradil K Applied Surface Science, 212, 110, 2003 |
| 10 |
Auger electron spectroscopy, ellipsometry and photoluminescence investigations of Zn1-xBexSe alloys Bukaluk A, Wronkowska AA, Wronkowski A, Arwin H, Firszt F, Legowski S, Meczynska H Applied Surface Science, 175, 531, 2001 |