검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Improvement of conversion efficiency of multicrystalline silicon solar cells by incorporating reactive ion etching texturing Liu SY, Niu XW, Shan W, Lu W, Zheng JY, Li YF, Duan HB, Quan WJ, Han WZ, Wronski CR, Yang DR Solar Energy Materials and Solar Cells, 127, 21, 2014 |
| 2 |
Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology Dahal LR, Li J, Stoke JA, Huang ZQ, Shan A, Ferlauto AS, Wronski CR, Collins RW, Podraza NJ Solar Energy Materials and Solar Cells, 129, 32, 2014 |
| 3 |
Analysis of controlled mixed-phase, amorphous plus microcrystalline. silicon thin films by real time spectroscopic ellipsometry Podraza NJ, Li J, Wronski CR, Dickey EC, Collins RW Journal of Vacuum Science & Technology A, 27(6), 1255, 2009 |
| 4 |
Phase engineering of a-Si : H solar cells for optimized performance Wronski CR, Collins RW Solar Energy, 77(6), 877, 2004 |
| 5 |
Intrinsic and light induced gap states in a-Si : H materials and solar cells - effects of microstructure Wronski CR, Pearce JM, Deng J, Vlahos V, Collins RW Thin Solid Films, 451-52, 470, 2004 |
| 6 |
Analytical model for optical functions of amorphous semiconductors and its implications for thin film solar cells Ferlauto AS, Ferreira GM, Pearce JM, Wronski CR, Collins RW, Deng X, Ganguly G Thin Solid Films, 455-56, 388, 2004 |
| 7 |
Evaluation of compositional depth profiles in mixed-phase (amorphous plus crystalline) silicon films from real time spectroscopic ellipsometry Ferlauto AS, Ferreira GM, Koval RJ, Pearce JM, Wronski CR, Collins RW, Al-Jassim MM, Jones KM Thin Solid Films, 455-56, 665, 2004 |
| 8 |
Evolution of microstructure and phase in amorphous, protocrystalline, and micro crystalline silicon studied by real time spectroscopic ellipsometry Collins RW, Ferlauto AS, Ferreira GM, Chen C, Koh J, Koval RJ, Lee Y, Pearce JM, Wronski CR Solar Energy Materials and Solar Cells, 78(1-4), 143, 2003 |
| 9 |
A new perspective on the characterization of materials for a-Si : H solar cells Jiao L, Niu X, Lu Z, Wronski CR, Matsuda A, Kamei T, Ganguly G Solar Energy Materials and Solar Cells, 66(1-4), 231, 2001 |
| 10 |
Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry Collins RW, Koh J, Fujiwara H, Rovira PI, Ferlauto AS, Zapien JA, Wronski CR, Messier R Applied Surface Science, 154, 217, 2000 |