검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The effect of contact resistance on current crowding and electromigration in ULSI multi-level interconnects Huang JS, Yeh ECC, Zhang ZB, Tu KN Materials Chemistry and Physics, 77(2), 377, 2003 |
| 2 |
A robust multilevel interconnect module for subquartermicrometer complementary metal oxide semiconductor technology integration Zhang ZB, Huang JS, Twiford M, Martin E, Layadi N, Salah A, Bhowmik B, Vitkavage D, Lytle S, Yeh ECC, Tu KN Journal of the Electrochemical Society, 149(5), G324, 2002 |