검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment Chang KC, Chen JH, Tsai TM, Chang TC, Huang SY, Zhang R, Chen KH, Syu YE, Chang GW, Chu TJ, Liu GR, Su YT, Chen MC, Pan JH, Liao KH, Tai YH, Young TF, Sze SM, Ai CF, Wang MC, Huang JW Journal of Supercritical Fluids, 85, 183, 2014 |
| 2 |
Low-Temperature Synthesis of ZnO Nanotubes by Supercritical CO2 Fluid Treatment Chang KC, Tsai TM, Chang TC, Syu YE, Huang HC, Hung YC, Young TF, Gan DS, Ho NJ Electrochemical and Solid State Letters, 14(9), K47, 2011 |
| 3 |
A 2 Bit Nonvolatile Memory Device with a Transistor Switch Function Accomplished with Edge-FN Tunneling Operation Jian FY, Chang TC, Chu AK, Chen SC, Chen TC, Hsu YE, Tseng HC, Lin CS, Young TF, Yang YL Electrochemical and Solid State Letters, 13(5), H166, 2010 |
| 4 |
Temperature-Dependent Biaxial Compressive Strain Effect on p-MOSFETs Kuo YJ, Chang TC, Dai CH, Chen SC, Lu J, Ho SH, Chao CH, Young TF, Cheng O, Huang CT Electrochemical and Solid State Letters, 12(2), H32, 2009 |
| 5 |
Thermal analysis on the degradation of poly-silicon TFTs under AC stress Weng CF, Chang TC, Tai YH, Huang ST, Wu KT, Chen CW, Kuo WC, Young TF Materials Chemistry and Physics, 116(2-3), 344, 2009 |
| 6 |
Substrate current enhancement in 65 nm metal-oxide-silicon field-effect transistor under external mechanical stress Kuo YJ, Chang TC, Yeh PH, Chen SC, Dai CH, Chao CH, Young TF, Cheng O, Huang CT Thin Solid Films, 517(5), 1715, 2009 |
| 7 |
Self-heating-induced negative bias temperature instability in poly-Si TFTs under dynamic stress Weng CF, Chang TC, Hsieh HP, Chen SC, Hsu WC, Kuo WC, Young TF Electrochemical and Solid State Letters, 11(8), H207, 2008 |
| 8 |
Self-Heating Effect Induced NBTI Degradation in Poly-Si TFTs under Dynamic Stress Weng CF, Chang TC, Hsieh HP, Chen SC, Hsu WC, Kuo WC, Young TF Journal of the Electrochemical Society, 155(12), H967, 2008 |
| 9 |
Study on annealing effects of Au thin films on Si Young TF, Chang JF, Ueng HY Thin Solid Films, 322(1-2), 319, 1998 |