검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Improvement in bias stability of amorphous-InGaZnO4 thin film transistors with SiOx passivation layers Lim W, Douglas EA, Norton DP, Pearton SJ, Ren F, Heo YW, Son SY, Yuh JH Journal of Vacuum Science & Technology B, 28(1), 116, 2010 |
| 2 |
Study of interface degradation of Hf-silicate gate dielectrics during thermal nitridation process Son SY, Jang JH, Kumar P, Singh RK, Yuh JH, Cho H, Kang CJ Journal of Vacuum Science & Technology B, 27(1), 71, 2009 |
| 3 |
Transparent dual-gate InGaZnO thin film transistors: OR gate operation Lim W, Douglas EA, Lee J, Jang J, Craciun V, Norton DP, Pearton SJ, Ren F, Son SY, Yuh JH, Shen H, Chang W Journal of Vacuum Science & Technology B, 27(5), 2128, 2009 |
| 4 |
Thermal stability of the exchange-biased NiFe/IrMn/CoFe electrode in the magnetic tunnel junctions Jeong HD, Lee JH, Yoon CS, Kim CK, Yuh JH Applied Surface Science, 199(1-4), 6, 2002 |