검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Principal component analysis: Reveal camouflaged information in x-ray absorption spectroscopy photoemission electron microscopy of complex thin oxide films Giesen M, Jugovac M, Zamborlini G, Feyer V, Gunkel F, Mueller DN Thin Solid Films, 665, 75, 2018 |
| 2 |
Schottky barrier measurements on individual GaAs nanowires by X-ray photoemission microscopy di Mario L, Turchini S, Zamborlini G, Feyer V, Tian L, Schneider CM, Rubini S, Martelli F Applied Surface Science, 386, 72, 2016 |