검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries Oswald S, Hoffmann M, Zier M Applied Surface Science, 401, 408, 2017 |
| 2 |
Challenges for lithium species identification in complementary Auger and X-ray photoelectron spectroscopy Hoffmann M, Zier M, Oswald S, Eckert J Journal of Power Sources, 288, 434, 2015 |
| 3 |
Lithium dendrite and solid electrolyte interphase investigation using OsO4 Zier M, Scheiba F, Oswald S, Thomas J, Goers D, Scherer T, Klose M, Ehrenberg H, Eckert J Journal of Power Sources, 266, 198, 2014 |
| 4 |
Parallel proximal probe arrays with vertical interconnections Sarov Y, Frank A, Ivanov T, Zollner JP, Ivanova K, Volland B, Rangelow IW, Brogan A, Wilson R, Zawierucha P, Zielony M, Gotszalk T, Nikolov N, Zier M, Schmidt B, Kostic I Journal of Vacuum Science & Technology B, 27(6), 3132, 2009 |
| 5 |
Scanning proximal probes for parallel imaging and lithography Ivanova K, Sarov Y, Ivanov T, Frank A, Zollner J, Bitterlich C, Wenzel U, Volland BE, Klett S, Rangelow IW, Zawierucha P, Zielony M, Gotszalk T, Dontzov D, Schott W, Nikolov N, Zier M, Schmidt B, Engl W, Sulzbach T, Kostic I Journal of Vacuum Science & Technology B, 26(6), 2367, 2008 |
| 6 |
Depth profile and interface analysis in the nm-range Oswald S, Reiche R, Zier M, Baunack S, Wetzig K Applied Surface Science, 252(1), 3, 2005 |
| 7 |
XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and Si Zier M, Oswald S, Reiche R, Wetzig K Applied Surface Science, 252(1), 234, 2005 |