검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Mg2Sn heterostructures on Si(111) substrate Dozsa L, Galkin NG, Pecz B, Osvath Z, Zolnai Z, Nemeth A, Galkin KN, Chernev IM, Dotsenko SA Applied Surface Science, 405, 111, 2017 |
| 2 |
Optical and structural characterization of Ge clusters embedded in ZrO2 Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P Applied Surface Science, 421, 283, 2017 |
| 3 |
Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide Lohner T, Serenyi M, Szilagyi E, Zolnai Z, Czigany Z, Khanh NQ, Petrik P, Fried M Applied Surface Science, 421, 636, 2017 |
| 4 |
Nondestructive atomic compositional analysis of BeMgZnO quaternary alloys using ion beam analytical techniques Zolnai Z, Toporkov M, Volk J, Demchenko DO, Okur S, Szabo Z, Ozgur U, Morkoc H, Avrutin V, Kotai E Applied Surface Science, 327, 43, 2015 |
| 5 |
Sparse and incomplete factorial matrices to screen membrane protein 2D crystallization Lasala R, Coudray N, Abdine A, Zhang Z, Lopez-Redondo M, Kirshenbaum R, Alexopoulos J, Zolnai Z, Stokes DL, Ubarretxena-Belandia I Journal of Structural Biology, 189(2), 123, 2015 |
| 6 |
Ar+ ion irradiation-induced reorganization of colloidal silica nanoparticles in Langmuir-Blodgett monolayers Lugomer S, Zolnai Z, Toth AL, Deak A, Nagy N Thin Solid Films, 574, 136, 2015 |
| 7 |
Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration Lohner T, Agocs E, Petrik P, Zolnai Z, Szilagyi E, Kovacs I, Szokefalvi-Nagy Z, Toth L, Toth AL, Illes L, Barsony I Thin Solid Films, 571, 715, 2014 |
| 8 |
Formation and characterization of semiconductor Ca2Si layers prepared on p-type silicon covered by an amorphous silicon cap Dozsa L, Molnar G, Zolnai Z, Dobos L, Pecz B, Galkin NG, Dotsenko SA, Bezbabny DA, Fomin DV Journal of Materials Science, 48(7), 2872, 2013 |
| 9 |
M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications Banyasz I, Berneschi S, Fried M, Lohner T, Conti GN, Righini GC, Pelli S, Zolnai Z Thin Solid Films, 541, 3, 2013 |
| 10 |
Multipulse irradiation of silicon by femtosecond laser pulses: Variation of surface morphology Lugomer S, Maksimovic A, Farkas B, Geretovszky Z, Szorenyi T, Toth AL, Zolnai Z, Barsony I Applied Surface Science, 258(8), 3589, 2012 |