| 1 |
Investigation of the dependence of phosphorus segregation on grain boundary structure in Fe-P-C alloy:.ross comparison between Atom Probe Tomography and Auger Electron Spectroscopy
Akhatova A, Christien F, Barnier V, Radiguet B, Cadel E, Cuvilly F, Pareige P
Applied Surface Science, 463, 203, 2019 |
| 2 |
Auger electron spectroscopy and UV-Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces
Stiedl J, Green S, Chasse T, Rebner K
Applied Surface Science, 486, 354, 2019 |
| 3 |
Morphology and element composition profiles of alumina films obtained by mixed thermal oxidation of AlN epitaxial layers
Domanowska A, Korbutowicz R, Teterycz H
Applied Surface Science, 484, 1234, 2019 |
| 4 |
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
Zemek J, Houdkova J, Jiricek P, Izak T, Kalbac M
Applied Surface Science, 491, 16, 2019 |
| 5 |
Graphene quantum dots obtained by unfolding fullerene
Kaciulis S, Mezzi A, Soltani P, Pizzoferrato R, Ciotta E, Prosposito P
Thin Solid Films, 673, 19, 2019 |
| 6 |
Yttrium ultra-thin films on the Si(100)2 x 1 surface and their in situ oxidation process
Vlachos D, Kamaratos M
Thin Solid Films, 673, 104, 2019 |
| 7 |
Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs
Debehets J, Homm P, Menghini M, Chambers SA, Marchiori C, Heyns M, Locquet JP, Seo JW
Applied Surface Science, 440, 386, 2018 |
| 8 |
Auger electron spectroscopy analysis for growth interface of cubic boron nitride single crystals synthesized under high pressure and high temperature
Lv MZ, Xu B, Cai LC, Guo XF, Yuan XD
Applied Surface Science, 439, 780, 2018 |
| 9 |
Surface characterization of low-temperature grown yttrium oxide
Krawczyk M, Lisowski W, Pisarek M, Nikiforow K, Jablonski A
Applied Surface Science, 437, 347, 2018 |
| 10 |
Composition effects of electrodeposited Co-Fe as electrocatalysts for the oxygen evolution reaction
Xiong M, Ivey DG
Electrochimica Acta, 260, 872, 2018 |
