| 1 |
Radiation damage in polymer films from grazing-incidence X-ray scattering measurements
Vaselabadi SA, Shakarisaz D, Ruchhoeft P, Strzalka J, Stein GE
Journal of Polymer Science Part B: Polymer Physics, 54(11), 1074, 2016 |
| 2 |
Challenges for lithium species identification in complementary Auger and X-ray photoelectron spectroscopy
Hoffmann M, Zier M, Oswald S, Eckert J
Journal of Power Sources, 288, 434, 2015 |
| 3 |
Positron beam studies of void swelling in ion irradiated Ti-modified stainless steel
Amarendra G, Panigrahi BK, Abhaya S, David C, Rajaraman R, Nair KGM, Sundar CS, Raj B
Applied Surface Science, 255(1), 139, 2008 |
| 4 |
Argon ion beam and electron beam-induced damage in Cu(In,Ga)Se-2 thin films
Yan YF, Jones KM, Noufi R, Al-Jassim MM
Thin Solid Films, 515(11), 4681, 2007 |
| 5 |
Impact energy dependence of SF5+ ion beam damage of poly(methyl methacrylate) studied by time-of-flight secondary ion mass spectrometry
Wagner MS, Gillen G
Applied Surface Science, 231-2, 169, 2004 |
| 6 |
Synchrotron radiation studies of the growth and beam damage of tin-phthalocyanine on GaAs(001)-1x6 substrates
Cabailh G, Wells JW, McGovern IT, Vearey-Roberts AR, Bushell A, Evans DA
Applied Surface Science, 234(1-4), 144, 2004 |
| 7 |
Cryo-negative staining reduces electron-beam sensitivity of vitrified biological particles
De Carlo S, El-Bez C, Alvarez-Rua C, Borge J, Dubochet J
Journal of Structural Biology, 138(3), 216, 2002 |
| 8 |
The secondary electron yield of TiZr and TiZrV non-evaporable getter thin film coatings
Henrist B, Hilleret N, Scheuerlein C, Taborelli M
Applied Surface Science, 172(1-2), 95, 2001 |
| 9 |
Vaporization, melting and heat conduction in the laser drilling process
Zhang YW, Faghri A
International Journal of Heat and Mass Transfer, 42(10), 1775, 1999 |
| 10 |
A novel method to detect the increase in the rubber concentration at the interface between the poly(vinyl chloride) (PVC) and styrene-butadiene copolymer (SBR) phases in compatibilized PVC/SBR blends
Zhu SH, Chan CM
Macromolecules, 31(5), 1690, 1998 |
