검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Improvements in star photometry for aerosol characterizations Perez-Ramirez D, Lyamani H, Olmo FJ, Alados-Arboledas L Journal of Aerosol Science, 42(10), 737, 2011 |
| 2 |
SIMS depth profiling and TEM imaging of the SIMS altered layer Christofi A, Walker JF, McPhail DS Applied Surface Science, 255(4), 1381, 2008 |
| 3 |
High resolution depth profiling of thin STO in high-k oxide material Ehrke U, Sears A, Alff L, Reisinger D Applied Surface Science, 231-2, 598, 2004 |
| 4 |
Correction for the loss of depth resolution with accurate depth calibration when profiling with Cs+ at angles of incidence above 50 degrees to normal Kelly JH, Dowsett MG, Augustus P, Beanland R Applied Surface Science, 203, 260, 2003 |
| 5 |
On determining accurate positions, separations, and internal profiles for delta layers Dowsett MG, Kelly JH, Rowlands G, Ormsby TJ, Guzman B, Augustus P, Beanland R Applied Surface Science, 203, 273, 2003 |
| 6 |
Determination of the variation in sputter yield in the SIMS transient region using MEIS Dowsett MG, Ormsby TJ, Gard FS, Al-Harthi SH, Guzman B, McConville CF, Noakes TCQ, Bailey P Applied Surface Science, 203, 363, 2003 |