검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Statistical root cause analysis of novel faults based on digraph models Wan YM, Yang F, Lv N, Xu HP, Ye H, Li WC, Xu P, Song LM, Usadi AK Chemical Engineering Research & Design, 91(1), 87, 2013 |
| 2 |
Layered Digraph Model for HAZOP Analysis of Chemical Processes Cui L, Zhao JS, Qiu T, Chen BZ Process Safety Progress, 27(4), 293, 2008 |
| 3 |
Statistical process monitoring using improved PCA with optimized sensor locations Wang HQ, Song ZH, Wang H Journal of Process Control, 12(6), 735, 2002 |