검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application Li B, Tao K, Liu XT, Liao W, Luo J Thin Solid Films, 353(1-2), 56, 1999 |
| No. | Article |
|---|---|
| 1 |
Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application Li B, Tao K, Liu XT, Liao W, Luo J Thin Solid Films, 353(1-2), 56, 1999 |