화학공학소재연구정보센터
검색결과 : 166건
No. Article
1 A novel device fabricated with Cu2NiSnS4 chalcogenide: Morphological and temperature-dependent electrical characterizations
Karabulut A, Sarilmaz A, Ozel F, Orak I, Sahinkaya MA
Current Applied Physics, 20(1), 58, 2020
2 Low interface trap density in scaled bilayer gate oxides on 2D materials via nanofog low temperature atomic layer deposition
Kwak I, Kavrik M, Park JH, Grissom L, Fruhberger B, Wong KT, Kang S, Kummel AC
Applied Surface Science, 463, 758, 2019
3 Multifunctional energy storage composite structures with embedded lithium-ion batteries
Ladpli P, Nardari R, Kopsaftopoulos F, Chang FK
Journal of Power Sources, 414, 517, 2019
4 Spatially resolved analysis of dopant concentration in axial GaAs NW pn-contacts
Nagelein A, Timm C, Schwarzburg K, Steidl M, Kleinschmidt P, Hannappel T
Solar Energy Materials and Solar Cells, 197, 13, 2019
5 Doping profile extraction in thin SOI films: Application to A2RAM
Wakam FT, Lacord J, Bawedin M, Martinie S, Cristoloveanu S, Ghibaudo G, Barbe JC
Solid-State Electronics, 159, 3, 2019
6 Comparison of memory effect with voltage or current charging pulse bias in MIS structures based on codoped Si-NCs embedded in SiO2 or HfOx
Mazurak A, Mroczynski R
Solid-State Electronics, 159, 157, 2019
7 A packed-bed DBD micro plasma reactor for CO2 dissociation: Does size matter?
Uytdenhouwen Y, Van Alphen S, Michielsen I, Meynen V, Cool P, Bogaerts A
Chemical Engineering Journal, 348, 557, 2018
8 Spectral-matching-ratio modelling based on ANNs and atmospheric parameters for the electrical characterization of multi-junction concentrator PV systems
Almonacid F, Fernandez EF, Almonacid-Ciuz B, Rodrigo PM
Energy, 156, 409, 2018
9 Review of fractional-order electrical characterization of supercapacitors
Allagui A, Freeborn TJ, Elwakil AS, Fouda ME, Maundy BJ, Radwan AG, Said Z, Abdelkareem MA
Journal of Power Sources, 400, 457, 2018
10 The photovoltaic impact of atomic layer deposited TiO2 interfacial layer on Si-based photodiodes
Karabulut A, Orak I, Turut A
Solid-State Electronics, 144, 39, 2018