검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Curvature radius measurement by optical profiler and determination of the residual stress in thin films Besnard A, Ardigo MR, Imhoff L, Jacquet P Applied Surface Science, 487, 356, 2019 |
| 2 |
Harmonic analysis for identification of nonlinearities in impedance spectroscopy Kiel M, Bohlen O, Sauer DU Electrochimica Acta, 53(25), 7367, 2008 |