검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Investigation of focused ion beam induced damage in single crystal diamond tools Tong Z, Luo XC Applied Surface Science, 347, 727, 2015 |
| 2 |
TEM observation of structural differences between two types of Ni silicide Si thin films caused by FIB irradiation Tanaka M, Furuya K, Saito T Thin Solid Films, 319(1-2), 101, 1998 |