검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Dose-dependence of ion implantation-caused damage in silicon measured by ellipsometry and backscattering spectrometry Fried A, Petrik P, Lohner T, Khanh NQ, Polgar O, Gyulai J Thin Solid Films, 455-56, 404, 2004 |
| 2 |
In-situ high temperature X-ray diffraction study of Ni/SiC interface reactions Fujimura T, Tanaka SI Journal of Materials Science, 34(2), 235, 1999 |
| 3 |
Interfacial Reaction and Adhesion Between SiC and Thin Sputtered Nickel Films Lim CS, Nickel H, Naoumidis A, Gyarmati E Journal of Materials Science, 32(24), 6567, 1997 |