검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
The impact of surface oxidation on energy spectra of keV ions scattered from transition metals Bruckner B, Bauer P, Primetzhofer D Applied Surface Science, 479, 1287, 2019 |
| 2 |
Double matrix effect in Low Energy Ion Scattering from La surfaces Zameshin AA, Yakshin AE, Sturm JM, Brongerma HH, Bijkerk F Applied Surface Science, 440, 570, 2018 |
| 3 |
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition Ghumman CAA, Moutinho AMC, Santos A, Teodoro OMND, Tolstogouzov A Applied Surface Science, 258(7), 2490, 2012 |
| 4 |
Functionality of novel black silicon based nanostructured surfaces studied by TOF SIMS Talian I, Aranyosiova M, Orinak A, Velic D, Hasko D, Kaniansky D, Orinakova R, Hubner J Applied Surface Science, 256(7), 2147, 2010 |
| 5 |
Probability of ionization of sputtered particles as a function of their energy - Part I: Negative Si- ions Kudriavtsev Y, Villegas A, Gallardo S, Asomoza R Applied Surface Science, 254(7), 2059, 2008 |
| 6 |
Cesium ion sputtering with oxygen flooding: Experimental SIMS study of work function change Kudriatsev Y, Villegas A, Gallardo S, Ramirez G, Asomoza R, Mishurnuy V Applied Surface Science, 254(16), 4961, 2008 |
| 7 |
Quantitative SIMS measurement of high concentration of boron in silicon (up to 20 at.%) using an isotopic comparative method Dubois C, Prudon G, Gautier B, Dupuy JC Applied Surface Science, 255(4), 1377, 2008 |
| 8 |
Static time-of-flight secondary ion mass spectrometry analysis of microelectronics related substrates using a polyatomic ion source Ravanel X, Trouiller C, Juhel M, Wyon C, Kwakman LFT, Leonard D Applied Surface Science, 255(4), 1440, 2008 |
| 9 |
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis Sakamoto T, Koizumi M, Kawasaki J, Yamaguchi J Applied Surface Science, 255(4), 1617, 2008 |
| 10 |
Quantitative fundamental SIMS studies using O-18 implant standards Williams P, Sobers RC, Franzreb K, Lorincik J Applied Surface Science, 252(19), 6429, 2006 |