| 1 |
Enhancement in MS-based peptide detection by microfluidic free-flow zone electrophoresis
Kinde TF, Hess N, Dutta D
Electrophoresis, 41(7-8), 545, 2020 |
| 2 |
The matrix effect in secondary ion mass spectrometry
Seah MP, Shard AG
Applied Surface Science, 439, 605, 2018 |
| 3 |
Matrix effects during monitoring of antibody and host cell proteins using attenuated total reflection spectroscopy
Capito F, Skudas R, Stanislawski B, Kolmar H
Biotechnology Progress, 29(1), 265, 2013 |
| 4 |
Adsorption of BTEX, MTBE and TAME on natural and modified diatomite
Aivalioti M, Papoulias P, Kousaiti A, Gidarakos E
Journal of Hazardous Materials, 207, 117, 2012 |
| 5 |
Determination of toxic and other trace elements in calcium-rich materials using cloud point extraction and inductively coupled plasma emission spectrometry
Borkowska-Burnecka J, Szymczycha-Madeja A, Zyrnicki W
Journal of Hazardous Materials, 182(1-3), 477, 2010 |
| 6 |
Quantitative SIMS measurement of high concentration of boron in silicon (up to 20 at.%) using an isotopic comparative method
Dubois C, Prudon G, Gautier B, Dupuy JC
Applied Surface Science, 255(4), 1377, 2008 |
| 7 |
ToF-SIMS analysis of bio-systems: Are polyatomic primary ions the solution?
Jones EA, Fletcher JS, Thompson CE, Jackson DA, Lockyer NP, Vickerman JC
Applied Surface Science, 252(19), 6844, 2006 |
| 8 |
Matrix effects in SIMS depth profiles of SiGe relaxed buffer layers
Sanchez-Almazan F, Napolitani E, Carnera A, Drigo AV, Isella G, von Kanel H, Berti M
Applied Surface Science, 231-2, 704, 2004 |
| 9 |
Role of matrix material in the characterization of high-purity copper by flame and graphite furnace AAS
Kumar SA, Sanglikar MB, Shaikh MS, Sudersanan M
Indian Journal of Chemical Technology, 11(2), 170, 2004 |
| 10 |
Quantitative depth profiling at silicon/silicon oxide interfaces by means of Cs+ sputtering in negative mode by ToF-SIMS: a full spectrum approach
Ferrari S, Perego A, Fanciulli A
Applied Surface Science, 203, 52, 2003 |
