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Pinus sylvestris L. needle surface wettability parameters as indicators of atmospheric environment pollution impacts: Novel contact angle hysteresis methodology Pogorzelski SJ, Rochowski P, Szurkowski J Applied Surface Science, 292, 857, 2014 |
2 |
Low-temperature oxidation of SiC surfaces by supercritical water oxidation Futatsuki T, Oe T, Aoki H, Komatsu N, Kimura C, Sugino T Applied Surface Science, 256(22), 6512, 2010 |
3 |
Recent approaches to highly hydrophobic textile surfaces Bahners T, Textor T, Opwis K, Schollmeyer E Journal of Adhesion Science and Technology, 22(3-4), 285, 2008 |
4 |
Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristic parameters Sahoo NK, Thakur S, Tokas RB Thin Solid Films, 503(1-2), 85, 2006 |
5 |
Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses Senthilkumar M, Sahoo NK, Thakur S, Tokas RB Applied Surface Science, 252(5), 1608, 2005 |
6 |
Synthetic diamond electrodes: The effect of surface microroughnesson the electrochemical properties of CVD diamond thin films on titanium Pleskov YV, Evstefeeva YE, Krotova MD, Lim PY, Shih HC, Varnin VP, Teremetskaya IG, Vlasov II, Ralchenko VG Journal of Applied Electrochemistry, 35(9), 857, 2005 |
7 |
Adhesion improvement of electroless copper to a polyimide film substrate by combining surface microroughening and imide ring cleavage Wang ZL, Furuya A, Yasuda K, Ikeda H, Baba T, Hagiwara M, Toki S, Shingubara S, Kubota H, Ohmi T Journal of Adhesion Science and Technology, 16(8), 1027, 2002 |
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Effects of initial nitridation on the characteristics of SiC-SiO2 interfaces Cheong KY, Dimitrijev S, Han J Materials Science Forum, 433-4, 583, 2002 |
9 |
Leakage current distribution in ultrathin oxide on silicon surface with step/terrace structures Murata M, Tokuda N, Hojo D, Yamabe K Thin Solid Films, 414(1), 56, 2002 |
10 |
Corrosion rate of n- and p-silicon substrates in HF, HF+HCl, and HF+NH4F aqueous solutions Bertagna V, Erre R, Rouelle F, Chemla M Journal of the Electrochemical Society, 146(1), 83, 1999 |