검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Degradation behavior of crystalline silicon solar cells in a cell-level potential-induced degradation test Yamaguchi S, Ohdaira K Solar Energy, 155, 739, 2017 |
| 2 |
A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM Aziza H, Bocquet M, Moreau M, Portal JM Solid-State Electronics, 103, 73, 2015 |
| 3 |
Reliability of Fine-Pitch Flip-Chip (COG) Bonding with Non-Conductive Film Using Ultrasonic Energy Jo JL, Lee JB, Kim JM, Shin YE, Jung SB Journal of Adhesion, 86(5-6), 470, 2010 |
| 4 |
Ultrasonic Bonding of Electrodes of Rigid and Flexible Printed Circuit Boards with Non-Conductive Film (NCF) Lee JB, Koo JM, Kim JW, Noh BI, Lee JG, Jung SB Journal of Adhesion, 85(6), 341, 2009 |
| 5 |
Anisotropic conductive adhesives for flip-chip interconnects Wang WQ, Chan YC, Pecht M Journal of Adhesion Science and Technology, 22(8-9), 871, 2008 |