검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Non volatile memory reliability evaluation based on oxide defect generation rate during stress and retention test Aziza H, Portal JM, Plantier J, Reliaud C, Regnier A, Ogier JL Solid-State Electronics, 78, 151, 2012 |
| 2 |
Fouling behaviour of polyethersulfone UF membranes made with different PVP Marchese J, Ponce M, Ochoa NA, Pradanos P, Palacio L, Hernandez A Journal of Membrane Science, 211(1), 1, 2003 |
| 3 |
Pore size distributions based on AFM imaging and retention of multidisperse polymer solutes - Characterisation of polyethersulfone UF membranes with dopes containing different PVP Ochoa NA, Pradanos P, Palacio L, Pagliero C, Marchese J, Hernandez A Journal of Membrane Science, 187(1-2), 227, 2001 |