| 1 |
Performance enhancement of heterojunction ZnO/PbS quantum dot solar cells by interface engineering
Kumar S, Upadhyay R, Pradhan B
Solar Energy, 211, 283, 2020 |
| 2 |
Selective adsorption of oil on self-organized surface patterns formed over soft thin PDMS films
Basu S, Sarkar J
Chemical Engineering Science, 207, 970, 2019 |
| 3 |
Topography evolution of rough-surface metallic substrates by solution deposition planarization method
Chu JY, Zhao Y, Liu LF, Wu W, Zhang ZW, Hong ZY, Li YJ, Jin ZJ
Applied Surface Science, 427, 237, 2018 |
| 4 |
Multiscale modeling and experimental analysis of chemical vapor deposited aluminum films: Linking reactor operating conditions with roughness evolution
Aviziotis IG, Cheimarios N, Duguet T, Vahlas C, Boudouvis AG
Chemical Engineering Science, 155, 449, 2016 |
| 5 |
Controlled electropolishing of copper foils at elevated temperature
Kwon GD, Kim YW, Moyen E, Keum DH, Lee YH, Baik S, Pribat D
Applied Surface Science, 307, 731, 2014 |
| 6 |
Resistivity of thin gold films on mica induced by electron-surface scattering: Application of quantitative scanning tunneling microscopy
Robles ME, Gonzalez-Fuentes CA, Henriquez R, Kremer G, Moraga L, Oyarzun S, Suarez MA, Flores M, Munoz RC
Applied Surface Science, 258(8), 3393, 2012 |
| 7 |
Substrate Temperature Dependent Surface Morphology and Photoluminescence of Germanium Quantum Dots Grown by Radio Frequency Magnetron Sputtering
Samavati A, Othaman Z, Ghoshal SK, Dousti MR, Kadir MRA
International Journal of Molecular Sciences, 13(10), 12880, 2012 |
| 8 |
Microstructural properties of (In,Ga)(2)Se-3 precursor layers for efficient CIGS thin-film solar cells
Mise T, Nakada T
Solar Energy Materials and Solar Cells, 93(6-7), 1000, 2009 |
| 9 |
AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size
Fares B, Dubois C, Gautier B, Dupuy JC, Cayrel F, Gaudin G
Applied Surface Science, 252(19), 6448, 2006 |
| 10 |
Surface roughening and erosion rate change at low energy SIMS depth profiling of silicon during oblique O-2(+) bombardment
Fares B, Gautier B, Holliger P, Baboux N, Prudon G, Dupuy JC
Applied Surface Science, 253(5), 2662, 2006 |
