검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Oxygen flooding and sample cooling during depth profiling of HfSiON thin films Miwa S Applied Surface Science, 255(4), 1384, 2008 |
| 2 |
SIMS analysis using a new novel sample stage Miwa S, Nomachi I, Kitajima H Applied Surface Science, 252(19), 7318, 2006 |