| 1 |
Current and shot noise at spin-dependent hopping through junctions with ferromagnetic contacts
Sverdlov V, Selberherr S
Solid-State Electronics, 159, 43, 2019 |
| 2 |
Study on line edge roughness for electron beam acceleration voltages from 50 to 5 kV
Rio D, Constancias C, Saied M, Icard B, Pain L
Journal of Vacuum Science & Technology B, 27(6), 2512, 2009 |
| 3 |
Embedded electrode electrochemical noise monitoring of the corrosion beneath organic coatings induced by ac-dc-ac conditions
Su Q, Allahar K, Bierwagen G
Electrochimica Acta, 53(6), 2825, 2008 |
| 4 |
Noise resistance and shot noise parameters on the study of IGC of aluminiurn alloys with different heat treatments
Sanchez-Amaya JM, Bethencourt M, Gonzalez-Rovira L, Botana FJ
Electrochimica Acta, 52(23), 6569, 2007 |
| 5 |
Giant suppression of avalanche noise in GaN double-drift impact diodes
Reklaitis A, Reggiani L
Solid-State Electronics, 49(3), 405, 2005 |
| 6 |
Low-noise behavior of planar Mo/n-Si/Mo optical sensor structures
Khunkhao S, Aoki T, Masui T, Sato K
Solid-State Electronics, 48(1), 149, 2004 |
| 7 |
A study of noise and collateral phenomena observed in central-cathode magnetron devices
Karzhavin IA, Neyman BZ, Gundobin GS, Vislov VI, Lashenko AV, Levande AB
Applied Surface Science, 215(1-4), 291, 2003 |
| 8 |
Matrix representation of shot noise due to carrier generation in planar double Schottky-barrier structures
Khunkhao S, Masui T, Sato K
Solid-State Electronics, 47(5), 913, 2003 |
| 9 |
White noise due to photocurrents in planar MSM structures on low-resistivity Si
Khunkhao S, Niemcharoen S, Supadech S, Sato K
Solid-State Electronics, 47(10), 1869, 2003 |
| 10 |
Observation of photoinduced shot noise in planar Mo/n-Si/Mo structures with undepleted region
Niemcharoen S, Ando T, Supadech S, Yasumura Y, Sato K
Solid-State Electronics, 46(4), 481, 2002 |
