검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Ultra-thin SiO2 film studies: index, thickness, roughness and the initial oxidation regime Irene EA Solid-State Electronics, 45(8), 1207, 2001 |
| No. | Article |
|---|---|
| 1 |
Ultra-thin SiO2 film studies: index, thickness, roughness and the initial oxidation regime Irene EA Solid-State Electronics, 45(8), 1207, 2001 |