| 1 |
Autonomous Oscillations and Pattern Formation with Zero External Resistance during Silicon Electrodissolution
Patzauer M, Hueck R, Tosolini A, Schonleber K, Krischer K
Electrochimica Acta, 246, 315, 2017 |
| 2 |
Light-activated electrochemistry on alkyne-terminated Si(100) surfaces towards solution-based redox probes
Wu YF, Kashi MB, Yang Y, Goncales VR, Ciampi S, Tilley RD, Gooding JJ
Electrochimica Acta, 213, 540, 2016 |
| 3 |
A comparison of modeling frameworks for the oscillatory silicon electrodissolution
Schonleber K, Patzauer M, Krischer K
Electrochimica Acta, 210, 346, 2016 |
| 4 |
The influence of carrier density and doping type on lithium insertion and extraction processes at silicon surfaces
McSweeney W, Lotty O, Glynn C, Geaney H, Holmes JD, O'Dwyer C
Electrochimica Acta, 135, 356, 2014 |
| 5 |
Theoretical modelling of the I-V characteristics of p-type silicon in fluoride electrolyte in the first electropolishing plateau
Cheggou R, Kadoun A, Gabouze N, Ozanam F, Chazalviel JN
Electrochimica Acta, 54(11), 3053, 2009 |
| 6 |
Influence of chemical additives on the surface reactivity of Si in KOH solution
Philipsen HGG, Kelly JJ
Electrochimica Acta, 54(13), 3526, 2009 |
| 7 |
Semiconducting photocathodes for the reduction of dioxygen Part I. Characterisation of crystalline and amorphous p-Si
Abdel-Samad HS, Amin MA, Chazalviel JN, Ozanam F, Allongue P
Electrochimica Acta, 49(26), 4577, 2004 |
| 8 |
Etching of n-type silicon in (HF plus oxidant) solutions: in situ characterisation of surface chemistry
Safi M, Chazalviel JN, Cherkaoui M, Belaidi A, Gorochov O
Electrochimica Acta, 47(16), 2573, 2002 |
| 9 |
Variation of Layer Spacing in Self-Assembled Hafnium-1,10-Decanediylbis(Phosphonate) Multilayers as Determined by Ellipsometry and Grazing Angle X-Ray-Diffraction
Zeppenfeld AC, Fiddler SL, Ham WK, Klopfenstein BJ, Page CJ
Journal of the American Chemical Society, 116(20), 9158, 1994 |
