검색결과 : 24건
| No. | Article |
|---|---|
| 1 |
Chemical and morphological characterization of photoactive SiOx films electrodeposited on Pt substrate Krywko-Cendrowska A, Marot L, Steiner R, Mathys D, Meyer E, Szklarczyk M Journal of Electroanalytical Chemistry, 832, 311, 2019 |
| 2 |
Sulfur-Reducing Additives Based on Aluminosilicates Al-SBA-15 and Al-SBA-16 for Cracking catalysts Glotov AP, Levshakov NS, Artemova MI, Smirnova EM, Vutolkina AV, Lysenko SV Chemistry and Technology of Fuels and Oils, 54(1), 15, 2018 |
| 3 |
Catalytic ammonia combustion properties and operando characterization of copper oxides supported on aluminum silicates and silicon oxides Hinokuma S, Kiritoshi S, Kawabata Y, Araki K, Matsuki S, Sato T, Machida M Journal of Catalysis, 361, 267, 2018 |
| 4 |
Spectroscopic characterization and photoactivity of SiOx-based films electrochemically grown on Cu surfaces Krywko-Cendrowska A, Marot L, Philippe L, Strawski M, Meyer E, Szklarczyk M Journal of Applied Electrochemistry, 47(8), 917, 2017 |
| 5 |
Screening of supported and unsupported Mn-Si oxygen carriers for CLOU (chemical-looping with oxygen uncoupling) Frick V, Ryden M, Leion H, Mattisson T, Lyngfelt A Energy, 93, 544, 2015 |
| 6 |
High-Performance and Low-Power Rewritable SiOx 1 kbit One Diode-One Resistor Crossbar Memory Array Wang G, Lauchner AC, Lin J, Natelson D, Palem KV, Tour JM Advanced Materials, 25(34), 4789, 2013 |
| 7 |
Characterization of anodic silicon oxide films grown in room temperature ionic liquids Fiorito PA, Alves WA, Bazitoi FFC, El Haber F, Froyer G, de Torresi SIC, Torresi RM Electrochimica Acta, 53(25), 7396, 2008 |
| 8 |
Oxide-assisted growth of silicon nanowires by carbothermal evaporation Hutagalung SD, Yaacob KA, Aziz AFA Applied Surface Science, 254(2), 633, 2007 |
| 9 |
Determining adhesion and hermeticity of the interface between encapsulation polymer and insulating layer of micro-sensing chips via a capacitance-voltage technique Lin YS, Ting JM, Chou TC, Li CC, Huang JL Thin Solid Films, 515(17), 6827, 2007 |
| 10 |
X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation Zhu XP, Yukawa T, Hirai M, Suematsu H, Jiang WH, Yatsui K, Nishiyama H, Inoue Y Applied Surface Science, 252(16), 5776, 2006 |