| 1 |
Plasma Impedance Analysis: A Novel Approach for Investigating a Phase Transition from a-Si:H to nc-Si:H
Chaudhary D, Sharma M, Sudhakar S, Kumar S
Plasma Chemistry and Plasma Processing, 37(1), 189, 2017 |
| 2 |
Antireflection TiO2 coatings on textured surface grown by HiPIMS
Visniakov J, Janulevicius A, Maneikis A, Matulaitiene I, Selskis A, Stanionyte S, Suchodolskis A
Thin Solid Films, 628, 190, 2017 |
| 3 |
Hydrogenated amorphous silicon thin film anode for proton conducting batteries
Meng TJ, Young K, Beglau D, Yan SL, Zeng P, Cheng MMC
Journal of Power Sources, 302, 31, 2016 |
| 4 |
Investigation of the chemo-mechanical coupling in lithiation/delithiation of amorphous Si through simulations of Si thin films and Si nanospheres
Wang M, Xiao XR
Journal of Power Sources, 326, 365, 2016 |
| 5 |
Preparation of Silicon Thin Films of Different Phase Composition from Monochlorosilane as a Precursor by RF Capacitive Plasma Discharge
Mochalov LA, Kornev RA, Nezhdanov AV, Mashin AI, Lobanov AS, Kostrov AV, Vorotyntsev VM, Vorotyntsev AV
Plasma Chemistry and Plasma Processing, 36(3), 849, 2016 |
| 6 |
Aluminium induced texturing of glass substrates with improved light management for thin film solar cells
Llusca M, Urbain F, Smirnov V, Antony A, Andreu J, Bertomeu J
Solar Energy Materials and Solar Cells, 147, 276, 2016 |
| 7 |
UV and visible photoluminescence emission intensity of undoped and In-doped ZnO thin film and photoresponsivity of ZnO: In/Si hetero-junction
Zebbar N, Chabane L, Gabouze N, Kechouane M, Trari M, Aida MS, Belhousse S, Larbi FH
Thin Solid Films, 605, 89, 2016 |
| 8 |
Effects of the Si/Al layer thickness on the continuity, crystalline orientation and the growth kinetics of the poly-Si thin films formed by aluminum-induced crystallization
Tutashkonko S, Usami N
Thin Solid Films, 616, 213, 2016 |
| 9 |
Evaluation of the Electrical Asymmetry Effect by spectroscopic measurements of capacitively coupled discharges and silicon thin film depositions
Schungel E, Hofmann R, Mohr S, Schulze J, Ropcke J, Czarnetzki U
Thin Solid Films, 574, 60, 2015 |
| 10 |
In-situ determination of the coefficient of thermal expansion of polysilicon thin films using micro-rotating structures
Liu HY, Li WH, Zhou ZF, Huang QA
Thin Solid Films, 552, 184, 2014 |
