화학공학소재연구정보센터
검색결과 : 609건
No. Article
1 산소가 첨가된 Cr 박막의 NH3 분위기에서의 질화 처리에 의한 구조적 특성
김단비, 김선태
Korean Journal of Materials Research, 31(11), 635, 2021
2 Effect of TaN intermediate layer on the back contact reaction of sputter-deposited Cu poor Cu2ZnSnS4 and Mo
Zhult S, Wong TKS, Tyukalova E, Guchhait A, Seng DHL, Tripathy S, Wong TI, Sharma M, Medina H, Duchamp M, Wong LH, Dalapati GK
Applied Surface Science, 471, 277, 2019
3 Analysis of vertical phase distribution in reactively sputtered zinc oxysulfide thin films
Cho DH, Lee WJ, Shin B, Chung YD
Applied Surface Science, 486, 555, 2019
4 Facile and precise fabrication of 10-nm nanostructures on soft and hard substrates
Woo JY, Jo S, Oh JH, Kim JT, Han CS
Applied Surface Science, 484, 317, 2019
5 Prediction and experimental determination of the layer thickness in SIMS depth profiling of Ge/Si multilayers: Effect of preferential sputtering and atomic mixing
Lian SY, Kim KJ, Kim TG, Hofmann S, Wang JY
Applied Surface Science, 481, 1103, 2019
6 Model approximation and stabilization of reactive sputter processes
Woelfel C, Bockhorn D, Awakowicz P, Lunze J
Journal of Process Control, 83, 121, 2019
7 Model approximation and stabilization of reactive sputter processes
Woelfel C, Bockhorn D, Awakowicz P, Lunze J
Journal of Process Control, 83, 121, 2019
8 Small amount TiB2 addition into B4C through sputter deposition and hot pressing
Hwang C, DiPietro S, Xie KY, Yang QR, Celik AM, Khan AU, Domnich V, Walck S, Hemker KJ, Haber RA
Journal of the American Ceramic Society, 102(8), 4421, 2019
9 High performance perovskite sub-module with sputtered SnO2 electron transport layer
Bai GF, Wu ZL, Li J, Bu TL, Li WN, Li W, Huang FZ, Zhang Q, Cheng YB, Zhong J
Solar Energy, 183, 306, 2019
10 Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O-2(+) ion bombardment
Yan XL, Duvenhage MM, Wang JY, Swart HC, Terblans JJ
Thin Solid Films, 669, 188, 2019