검색결과 : 1건
No. | Article |
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1 |
Measurement of Adhesion Force by a Symmetric AFM Probe for Nano-imprint Lithography Application Lee HJ, Hyun S, Kim JH, Lee HJ, Choi DG, Lee DI, Jeong JH, Lee ES Journal of Adhesion Science and Technology, 22(13), 1379, 2008 |