| 1 |
On the formation of core-shell granules in batch high shear granulators at two scales
Mandi FM, Mehrabi M, Hassanpour A, Muller FL
Powder Technology, 356, 253, 2019 |
| 2 |
A novel method for determining the thickness of hydration shells on nanosheets: A case of montmorillonite in water
Zhao YL, Yi H, Jia FF, Li HL, Peng CS, Song SX
Powder Technology, 306, 74, 2017 |
| 3 |
Thickness determination of molecularly thin lubricant films by angle-dependent X-ray photoelectron spectroscopy
Pang CJ, Bai MW
Applied Surface Science, 253(10), 4688, 2007 |
| 4 |
Structural characterisation of Sb-based heterostructures by X-ray scattering methods
Renard C, Durand O, Marcadet X, Massies J, Parillaud O
Applied Surface Science, 253(1), 112, 2006 |
| 5 |
Fourier-inversion and wavelet-transform methods applied to X-ray reflectometry and HRXRD profiles from complex thin-layered heterostructures
Durand O, Morizet N
Applied Surface Science, 253(1), 133, 2006 |
| 6 |
Structural characterisation of GaAlN/GaN HEMT heterostructures
Sarazin N, Durand O, Magis M, Poisson MADF, Di Persio J
Applied Surface Science, 253(1), 228, 2006 |
| 7 |
Improving the control of the electroless plating synthesis of Pd/Ag membranes for hydrogen separation using Rutherford backscattering
Witjens LC, Bitter JH, van Dillen AJ, Arnoldbik WM, Habraken FHPM, de Jong KP
Journal of Membrane Science, 254(1-2), 241, 2005 |
| 8 |
Thickness determination of thin polycrystalline films by grazing incidence X-ray diffraction
Lhotka J, Kuzel R, Cappuccio G, Valvoda V
Materials Science Forum, 443-4, 115, 2004 |
| 9 |
Interfacial oxide determination and chemical/electrical structures of WO2/SiOx/Si gate dielectrics
Xie L, Zhao Y, White MH
Solid-State Electronics, 48(10-11), 2071, 2004 |
| 10 |
Characterization of multilayered materials for optoelectronic components by high-resolution X-ray diffractometry and reflectometry: contribution of numerical treatments
Durand O
Thin Solid Films, 450(1), 51, 2004 |
