| 1 |
Microstructure and mechanical properties of stress-tailored piezoelectric AlN thin films for electro-acoustic devices
Reusch M, Cherneva S, Lu Y, Zukauskaite A, Kirste L, Holc K, Datcheva M, Stoychev D, Lebedev V, Ambacher O
Applied Surface Science, 407, 307, 2017 |
| 2 |
In situ stress measurements during electrochemical cycling of lithium-rich cathodes
Nation L, Li JC, James C, Qi Y, Dudney N, Sheldon BW
Journal of Power Sources, 364, 383, 2017 |
| 3 |
Stress-strain measurement of ultra-thin polystyrene films: Film thickness and molecular weight dependence of crazing stress
Hasegawa H, Ohta T, Ito K, Yokoyama H
Polymer, 123, 179, 2017 |
| 4 |
Defect elimination in solid-phase crystallised Si thin films by line-focus diode laser annealing
Li W, Varlamov S, Huang JL
Thin Solid Films, 576, 42, 2015 |
| 5 |
Silver layer instability in a SnO2/Ag/SnO2 trilayer on silicon
Kim SJ, Stach EA, Handwerker CA
Thin Solid Films, 520(19), 6189, 2012 |
| 6 |
Thickness dependent microstructural changes in La0.5Ca0.5MnO3 thin films deposited on (111) SrTiO3
Aydogdu GH, Kuru Y, Nelayah J, van Aken PA, Habermeier HU
Thin Solid Films, 518(16), 4667, 2010 |
| 7 |
Stress induced crystallization of hydrogenated amorphous silicon
Park J, Kwon S, Jun SI, Ivanov IN, Cao JB, Musfeldt JL, Rack PD
Thin Solid Films, 517(11), 3222, 2009 |
| 8 |
Optimization of sputtered Cr/Au thin film for diaphragm-based MEMS applications
Tan CW, Miao JM
Thin Solid Films, 517(17), 4921, 2009 |
| 9 |
Thin film stress measurement by instrumented optical fibre displacement sensor
Chowdhury S, Laugier MT
Applied Surface Science, 253(9), 4289, 2007 |
| 10 |
Effect of film stress on electrochemical properties of lithium manganese oxide thin films
Moon HS, Lee W, Reucroft PJ, Park JW
Journal of Power Sources, 119, 710, 2003 |
