검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Atomic layer deposition and characterization of zirconium oxide-erbium oxide nanolaminates Tamm A, Heikkila M, Kemel M, Kozlova J, Kukli K, Sammelselg V, Ritala M, Leskela M Thin Solid Films, 519(2), 666, 2010 |
| 2 |
Morphological and chemical study of the initial growth of US thin films deposited using an ammonia-free chemical process Mazon-Montijo DA, Sotelo-Lerma M, Quevedo-Lopez M, EI-Bouanani M, Alshareef HN, Espinoza-Beltran FJ, Ramirez-Bon R Applied Surface Science, 254(2), 499, 2007 |
| 3 |
Field-induced anomalous changes in Cr/a-Si : H/V thin film structures Hu J, Snell AJ, Hajto J, Rose MJ, Edmiston W Thin Solid Films, 396(1-2), 240, 2001 |
| 4 |
Junction properties of nickel phthalocyanine thin film devices utilising indium injecting electrodes Shafai TS, Anthopoulos TD Thin Solid Films, 398-399, 361, 2001 |
| 5 |
Limits of validity of the crystallite group method in stress determination of thin film structures Gergaud P, Labat S, Thomas O Thin Solid Films, 319(1-2), 9, 1998 |