검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Quantitative fundamental SIMS studies using O-18 implant standards Williams P, Sobers RC, Franzreb K, Lorincik J Applied Surface Science, 252(19), 6429, 2006 |
| 2 |
Quantitative measurement of O/Si ratios in oxygen- sputtered silicon using O-18 implant standards Sobers RC, Franzreb K, Williams P Applied Surface Science, 231-2, 729, 2004 |