1 |
Optical monitoring of thin film properties using in-situ measurement of transmittance and reflectance van Nijnatten PA Thin Solid Films, 517(10), 3087, 2009 |
2 |
Optical analysis of coatings by variable angle spectrophotometry Van Nijnatten PA Thin Solid Films, 516(14), 4553, 2008 |
3 |
Optical monitoring tools and strategies for controlling coating deposition in large area continuous coating processes van Nijnatten PA Thin Solid Films, 502(1-2), 147, 2006 |
4 |
Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers van Nijnatten PA, Hutchins MG, Kilbey NB, Roos A, Gelin K, Geotti-Bianchini F, Polato P, Anderson C, Olive F, Kohl M, Spragg R, Turner P Thin Solid Films, 502(1-2), 164, 2006 |
5 |
An automated directional reflectance/transmittance analyser for coating analysis van Nijnatten PA Thin Solid Films, 442(1-2), 74, 2003 |
6 |
A spectrophotometer accessory for directional reflectance and transmittance of coated glazing Van Nijnatten PA Solar Energy, 73(3), 137, 2002 |
7 |
A pseudo-Fresnel approach for predicting directional optical properties of coated glazing van Nijnatten PA Thin Solid Films, 392(2), 282, 2001 |
8 |
Predictive algorithms for directional optical properties of coated glazing for building and automotive applications van Nijnatten PA Thin Solid Films, 351(1-2), 295, 1999 |