검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Spectroscopic and kinetic ellipsometry studies of hot-wire deposited polycrystalline silicon on glass van Veenendaal PATT, van der Mark GWM, Rath JK, Schropp REI Thin Solid Films, 430(1-2), 41, 2003 |
| No. | Article |
|---|---|
| 1 |
Spectroscopic and kinetic ellipsometry studies of hot-wire deposited polycrystalline silicon on glass van Veenendaal PATT, van der Mark GWM, Rath JK, Schropp REI Thin Solid Films, 430(1-2), 41, 2003 |