Current Applied Physics

Current Applied Physics, Vol.3, No.1 Entire volume, number list

ISSN: 1567-1739 (Print)

In this Issue (18 articles)

1 - 1	Special issue - Second International Workshop on Ion Beam Techniques for the Analysis of Composition and Structure with Single Atomic Resolution - Kyongju, Korea, 24-27 September 2002 Moon D
3 - 7	Charge exchange for medium energy He and Ne ions in a large-angle collision at solid surfaces Kido Y, Semba S, Hoshino Y
9 - 11	High-resolution depth profiling of ultrashallow boron implants in silicon using high-resolution RBS Kimura K, Oota Y, Nakajima K, Buyuklimanli TH
13 - 17	Femtosecond electron dynamics on solid surfaces probed by low energy ion scattering and stimulated desorption of secondary ions Souda R
19 - 24	Structural studies at metallic surfaces and interfaces using MEIS Woodruff DP, Munoz-Marquez MA, Tanner RE
25 - 29	Reactive ion scattering study of physisorbed adsorbates: experiment and theory Lahaye RJWE, Kang H
31 - 34	Ion-induced emission microscopies Doyle BL, Walsh DS, Vizkelethy G, Rossi P, McDaniel FD, Schenkel T, McDonald J, Hamza AV
35 - 37	The role of basic energy-loss processes in layer-resolved surface investigations with ions Schiwietz G, Grande PL
39 - 44	Ion beam as a probe to study the behavior of hydrogen on silicon surfaces Oura K, Katayama M
45 - 49	Interface strain profiling in ultrathin SiO2 gate oxides with medium energy ion scattering spectroscopy Moon DW, Lee HI
51 - 55	Depth resolution and narrow nuclear resonance profiling Vickridge IC
57 - 60	Structure analysis of the Si(111)-root-3x root 3-Sb surface by means of CAICISS combined with LEED-AES-RBS techniques Kishi N, Morita K
61 - 64	Sputter damage in Si surface by low energy Ar+ ion bombardment Shin HC, Oh SK, Kang HJ, Lee HI, Moon DW
65 - 69	Exploring surface processes by coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysis Katayama M
71 - 74	A Cu(111)(root 3x root/3)R30 degrees-Sb structure by impact collision ion-scattering spectroscopy Umezawa K, Takaoka H, Hirayama S, Nakanishi S, Gibson WM
75 - 82	Depth profiling of ultrathin films using medium energy ion scattering Kim J, Lennard WN, McNorgan CP, Hendriks J, Mitchell IV, Landheer D, Gredley J
83 - 88	Atomic structure of Cs grown on Si(001)(2x1) surface by coaxial impact collision ion scattering spectroscopy Kim JY, Park JY, Seo JH, Whang CN, Kim SS, Choi DS, Kang HJ, Chae KH
89 - 92	Aspects of layer-by-layer composition analysis using MEIS Bailey P, Noakes TCQ, Baddeley CJ, van der Laan G, Brown D, Quinn PD, Woodruff DP