117 - 119 |
Maximum powers of low-loss series-shunt FET RF switches Yang Z, Hu X, Yang J, Simin G, Shur M, Gaska R |
120 - 123 |
Red electroluminescent devices based on rubrene derivative in 4,4'-N,N'-dicarubreneazole-biphenyl host and its application in white light emitting device for lighting purpose Li TL, Li WL, Li X, Han LL, Chu B, Li MT, Hu ZZ, Zhang ZQ |
124 - 126 |
A novel vertical channel self-aligned split-gate flash memory Wu DK, Zhou FL, Huang R, Li Y, Cai YM, Guo A, Zhang X, Wang YY |
127 - 133 |
Abnormally high local electrical fluctuations in heavily pocket-implanted bulk long MOSFET Cathignol A, Bordez S, Cros A, Rochereau K, Ghibaudo G |
134 - 139 |
Raman study of GaAs/Ga1-xAlxAs quantum dots: A dielectric continuum approach Zhong QH, Liu CH |
140 - 144 |
An analytic model for threshold voltage shift due to quantum confinement in surrounding gate MOSFETs with anisotropic effective mass Yuan Y, Yu B, Song J, Taur Y |
145 - 149 |
Analysis of the impact of the drain-junction tunneling effect on a microwave MOSFET from S-parameter measurements Torres-Rios E, Torres-Torres R, Gutierrez EA |
150 - 153 |
Gate-induced floating-body effect (GIFBE) in fully depleted triple-gate n-MOSFETs Na KI, Cristoloveanu S, Bae YH, Patruno P, Xiong W, Lee JH |
154 - 159 |
Application of Pd/Ge/Cu alloyed ohmic contact system to n-type GaAs for fully Cu-metallized InGaP/GaAs HBTs Chen KS, Chang EY, Lin CC, Lee CS |
160 - 165 |
New modes of THz generation by low-temperature-grown GaAsSb Hargreaves S, Bignell LJ, Lewis RA, Sigmund J, Hartnagel HL |
166 - 169 |
Maskless roughening of sapphire substrates for enhanced light extraction of nitride based blue LEDs Torma PT, Svensk O, Ali M, Suihkonen S, Sopanen M, Odnoblyudov MA, Bougrov VE |
170 - 175 |
A model for the C-V characteristics of the metal-ferroelectric-insulator-semiconductor structure Zhang JJ, Sun J, Zheng XJ |
176 - 180 |
Efficient electron transfers in ZnO nanorod arrays with N719 dye for hybrid solar cells Thitima R, Patcharee C, Takashi S, Susumu Y |
181 - 184 |
RF performance of GaAs pHEMT switches with various upper/lower delta-doped ratio designs Chiu HC, Fu JS, Chen CW |
185 - 189 |
Detailed analysis of parasitic loading effects on power performance of GaN-on-silicon HEMTs Xiao DP, Schreurs D, De Raedt W, Derluyn J, Germain M, Nauwelaers B, Borghs G |
190 - 194 |
On the breakdown behaviors of InP/InGaAs based heterojunction bipolar transistors (HBTs) Chen TP, Lee CJ, Lour WS, Guo DF, Tsai JH, Liu WC |
195 - 203 |
Silicon controlled rectifier (SCR) compact modeling based on VBIC and Gummel-Poon models Lou LF, Liou JJ, Dong SR, Han Y |
204 - 210 |
Passivation of 4H-SiC Schottky barrier diodes using aluminum based dielectrics Kumta A, Rusli, Xia JH |
211 - 217 |
Influence of electrical operating conditions and active layer thickness on electroluminescence degradation in polyfluorene-phenylene based light emitting diodes Romero B, Arredondo B, Alvarez AL, Mallavia R, Salinas A, Quintana X, Oton JM |
218 - 224 |
A CAD-compatible closed form approximation for the inversion charge areal density in double-gate MOSFETs Hariharan V, Vasi J, Rao VR |
225 - 233 |
Drain bias dependent bias temperature stress instability in a-Si:H TFT Tang Z, Park MS, Jin SH, Wie CR |
234 - 240 |
Parameter determination of Schottky-barrier diode model using differential evolution Wang KE, Ye MY |
241 - 245 |
Photocapacitance study at p-i-n photodiode by numerical C-V integration Kavasoglu AS, Kavasoglu N, Oktik S |
246 - 250 |
Organic thin-film transistor performance improvement using ammonia (NH3) plasma treatment on the gate insulator surface Fan CL, Yang TH, Chiu PC, Huang CH, Lin CI |