221 - 225 |
Open-circuit voltages: Theoretical and experimental optimizations of rear passivated silicon solar cells using Fz and Cz wafers Stem N, Ramos CAS, Cid M |
226 - 230 |
Influence of gate misalignment on the electrical characteristics of MuGFETS Lee CW, Afzalian A, Ferain I, Yan R, Akhavan ND, Xiong WZ, Colinge JP |
231 - 234 |
A low insertion loss GaAs pHEMT switch utilizing dual n(+)-doping AlAs etching stop layers design Chien FT, Lin DW, Yang CW, Fu JS, Chiu HC |
235 - 242 |
Transmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasitics Torres-Torres R, Venegas R, Decoutere S |
243 - 251 |
Quantitative prediction of junction leakage in bulk-technology CMOS devices Duffy R, Heringa A, Venezia VC, Loo J, Verheijen MA, Hopstaken MJP, van der Tak K, de Potter M, Hooker JC, Meunier-Beillard P, Delhougne R |
252 - 258 |
Capacitances in micro-strip detectors: A conformal mapping approach Cattaneo PW |
259 - 267 |
Capacitance-voltage characteristics and device simulation of bias temperature stressed a-Si:H TFTs Tang Z, Wie CR |
268 - 274 |
Compact model of the IGBTs with localized lifetime control dedicated to power circuit simulations Jankovic N, Igic P, Sakurai N |
275 - 278 |
Investigation of InGaP/GaAs/InGaAs camel-like gate delta-doped p-channel field-effect transistor Tsai JH, Lour WS, Huang CH, Dale NF, Lee YH, Sheng JS, Liu WC |
279 - 282 |
Thermal-stability performance of a metamorphic high electron mobility transistor (MHEMT) with non-annealed Ohmic contacts Chen LY, Cheng SY, Huang CC, Chen TP, Tsai TH, Liu YJ, Chen TY, Hsu CH, Liu WC |
283 - 287 |
Improved light extraction of GaN-based light-emitting diodes by ITO patterning with optimization design Wang P, Cao B, Wei W, Gan ZY, Liu S |
288 - 293 |
J-V characteristics of GaN containing traps at several discrete energy levels Jain A, Kumar P, Jain SC, Muralidharan R, Chand S, Kumar V |
294 - 298 |
Power added efficiency and linearity tradeoffs in GaN and GaAs microwave power HEMTs Okayama T, Rao MV |
299 - 302 |
High performance pMOS circuits with silicon-on-glass TFTs Kim JI, Choi JW, Choi W, Mativenga M, Jang J, Williams CK, Wang CC, Mozdy E, Cites J, Lai J, Tredwell TJ |
303 - 306 |
Formation of sub-micrometer polycrystalline-SiGe thin-film transistors by using a thinned channel layer Juang MH, Chang CW, Huang CW, Wang JL, Shye DC, Hwang CC, Jang SL |
307 - 315 |
Parameter set and data sampling strategy for accurate yet efficient statistical MOSFET compact model extraction Bindu B, Cheng B, Roy G, Wang X, Roy S, Asenov A |
316 - 322 |
Role of the substrate during pseudo-MOSFET drain current transients Park K, Nayak P, Schroder DK |
323 - 326 |
Stabilization of Al2O3 gate oxide on plastic substrate for low temperature poly-silicon by in situ plasma treatment Park DJ, Lim JW, Park BO |
327 - 335 |
The impact of self-heating and SiGe strain-relaxed buffer thickness on the analog performance of strained Si nMOSFETs Alatise OM, Kwa KSK, Olsen SH, O'Neill AG |
336 - 342 |
Silicon on insulator MESFETs for RF amplifiers Wilk SJ, Balijepalli A, Ervin J, Lepkowski W, Thornton TJ |