화학공학소재연구정보센터

Solid-State Electronics

Solid-State Electronics, Vol.54, No.5 Entire volume, number list
ISSN: 0038-1101 (Print) 

In this Issue (22 articles)

505 - 508 E-beam-evaporated Al2O3 for InAs/AlSb metal-oxide-semiconductor HEMT development
Lin HK, Fan DW, Lin YC, Chiu PC, Chien CY, Li PW, Chyi JI, Ko CH, Kuan TM, Hsieh MK, Lee WC, Wann CH
509 - 515 Enhancement in emission angle of the blue LED chip fabricated on lens patterned sapphire (0001)
Kissinger S, Jeong SM, Yun SH, Lee SJ, Kim DW, Lee IH, Lee CR
516 - 519 Formation of n-channel polycrystalline-Si thin-film transistors by dual source/drain implantation
Juang MH, Chang CW, Wang JL, Shye DC, Hwang CC, Jang SL
520 - 523 Compact capacitance modeling of a 3-terminal FET at zero drain-source voltage
Iniguez B, Moldovan O
524 - 526 Highly efficient undoped deep-blue electroluminescent device based on a novel pyrene derivative
Wang ZQ, Xu C, Wang WZ, Fu WJ, Niu LB, Ji BM
527 - 529 Substrate current verifying lateral electrical field under forward substrate biases for nMOSFETs
Huang HS, Wang MC, Hsieh ZY, Chen SY, Chuang AE, Liu CH
530 - 535 Explicit quantum potential and charge model for double-gate MOSFETs
Chaves F, Jimenez D, Sune J
536 - 540 Junction temperature in n-ZnO nanorods/(p-4H-SiC, p-GaN, and p-Si) heterojunction light emitting diodes
Alvi NH, Riaz M, Tzamalis G, Nur O, Willander M
541 - 544 Substrate-free large gap InGaN solar cells with bottom reflector
Tsai CL, Liu GS, Fan GC, Lee YS
545 - 551 Analysis of subthreshold conduction in short-channel recessed source/drain UTB SOI MOSFETs
Svilicic B, Jovanovic V, Suligoj T
552 - 556 An alternative passivation approach for AlGaN/GaN HEMTs
Lin HK, Yu HL, Huang FH
557 - 563 Sub-bandgap optical subthreshold current spectroscopy for extracting energy distribution of interface states in nitride-based charge trap flash memories
Jeon K, Lee S, Kim DM, Kim DH
564 - 567 Ultrathin DPN STI SiON liner for 40 nm low-power CMOS technology
Hu CY, Chen JF, Chen SC, Chang SJ, Lee KM, Lee CP
568 - 574 Formation of ohmic contact by pre-annealing of shallow nanopores in macroporous silicon and its characterization
Maji S, Das RD, Jana M, Roychaudhuri C, Mondal N, Dutta SK, Bandopadhyay NR, Saha H
575 - 578 Enhanced light output power of GaN-based light emitting diodes with overcut sideholes formed by wet etching
Kim HK, Kim HG, Kim HY, Ryu JH, Kang JH, Han N, Uthirakumar P, Hong CH
579 - 581 Enhance the split-gate flash cell performance by partially decoupling the SG oxide thickness from the tunnel oxide thickness
Dong YQ, Kong WR, Do N, Wang SL, Lee G
582 - 585 DC and RF characterization of AlGaN/GaN HEMTs with different gate recess depths
Lin HK, Huang FH, Yu HL
586 - 589 Contact resistance between Au and solution-processed CNT
Han SH, Lee SH, Hur JH, Jang J, Park YB, Irvin G, Drzaic P
590 - 594 Nitride-based blue light-emitting diodes with multiple MgxNy/GaN buffer layers
Fu YK, Kuo CH, Tun CJ, Chang LC
595 - 604 Surface-potential-based compact modeling of dynamically depleted SOI MOSFETs
Wu WM, Yao W, Gildenblat G
605 - 608 High efficient organic ultraviolet photovoltaic devices based on gallium complex
Su ZS, Chu B, Li WL
609 - 611 Shallow trench isolation-related narrow channel effect on the kink behaviour of 40 nm PD SOI NMOS device
Hung HJ, Kuo JB, Chen D, Tsai CT, Yeh C