998 - 1001 |
On-chip inductor above dummy metal patterns Hsu HM, Hsieh MM |
1002 - 1007 |
The influence of junction depth on short channel effects in vertical sidewall MOSFETs Tan L, Buiu O, Hall S, Gill E, Uchino T, Ashburn P |
1008 - 1010 |
4H-SiC BJTs with current gain of 110 Zhang QC, Agarwal A, Burka A, Geil B, Scozzie C |
1011 - 1017 |
2 MeV ion irradiation effects on AlGaN/GaN HFET devices Sonia G, Richtera E, Brunner F, Denker A, Lossy R, Mai M, Lenk F, Bundesmann J, Pensl G, Schmidt J, Zeimer U, Wang L, Baskar K, Weyers M, Wurfl J, Trankle G |
1018 - 1023 |
Comparison of heterostructure-emitter bipolar transistors (HEBTs) with InGaAs/GaAs superlattice and quantum-well base structures Tsai JH, Hsu IH, Li CM, Su NX, Wu YZ, Huang YS |
1024 - 1031 |
Investigation of the non-linear input capacitance in LDMOS transistors and its contribution to IMD and phase distortion Bengtsson O, Vestling L, Olsson J |
1032 - 1038 |
Thermionic field emission at electrodeposited Ni-Si Schottky barriers Kiziroglou ME, Li X, Zhukov AA, de Groot RAJ, de Groot CH |
1039 - 1042 |
Dependence of backgating on the type of deep centres in the substrate of GaAsFETs Sengouga N, Abdeslam NA |
1043 - 1046 |
Improved ESD properties by combining GaN-based light-emitting diode with MOS capacitor Chuang RW, Tsai PC, Su YX, Chu CH |
1047 - 1051 |
Silicon on insulator avalanche-impact-ionization transistor with very low switching voltage from ON state to OFF state Dobrovolsky V, Sizov F, Cristoloveanu S, Pavljuk S |
1052 - 1057 |
Calculation of cosmic ray limited maximum DC blocking voltages of high voltage silicon PIN diodes Bauef FD |
1058 - 1063 |
Modeling of double-pi equivalent circuit for on-chip symmetric spiral inductors Tang Y, Liu B, Zhang L, Pan J, Yang LW, Wang Y |
1064 - 1070 |
Compact model for short channel symmetric doped double-gate MOSFETs Cerdeira A, Iniguez B, Estrada M |
1071 - 1074 |
Effects of surface passivation in porous silicon as H-2 gas sensor Ali NK, Hashim MR, Aziz AA |
1075 - 1081 |
A proposal for enhancement of optical nonlinearity in GaN/AlGaN centered defect quantum box (CDQB) nanocrystal Rostami A, Saghai HR, Nejad HBA |
1082 - 1087 |
Reduced band-gap due to phonons in SrTiO3 analyzed by ab initio calculations Wunderlich W |
1088 - 1091 |
Surface-recombination-free InGaAs/InP HBTs and the base contact recombination Jin Z, Liu X, Prost W, Tegude FJ |
1092 - 1098 |
Evaluating MOSFET harmonic distortion by successive integration of the I-V characteristics Salazar R, Ortiz-Conde A, Garcia-Sancliez FJ, Ho CS, Liou JJ |
1099 - 1105 |
Influence of interface state charges on RF performance of LDMOS transistor Kashif A, Johansson T, Svensson C, Azam S, Arnborg T, Wahab Q |
1106 - 1113 |
Determination of the average channel temperature of GaN MOSHFETs under continuous wave and periodic-pulsed RF operational conditions Deng YQ, Islam MDM, Gaevski M, Yang ZJ, Adivarahan V, Khan A |